Lantronix SGX 5150 IoT Device Gateway SGX 5150 Certification Update US-34471-U - Page 1

Lantronix SGX 5150 IoT Device Gateway Manual

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Ref. Certif. No. US-34471-UL IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL EQUIPMENT (IECEE) CB SCHEME CB TEST CERTIFICATE Product Name and address of the applicant Name and address of the manufacturer Name and address of the factory Note: When more than one factory, please report on page 2 Ratings and principal characteristics Wireless Gateway LANTRONIX INC 7535 IRVINE CENTER DR, SUITE 100 IRVINE CA 92618 UNITED STATES LANTRONIX INC 7535 IRVINE CENTER DR, SUITE 100 IRVINE CA 92618 UNITED STATES HANA MICROELECTRONICS CO LTD (JIA XING) 18 HANA RD XINCHENG INDUSTRIAL PARK XIUZHOU DISTRICT JIAXING ZHEJIANG 314000 CHINA Additional Information on page 2 Optional Trademark (if any) Lantronix Inc. Type of Customer's Testing Facility (CTF) Stage used Model / Type Ref. SGX 35xx, SGX 51xx See Page 2 Additional information (if necessary may also be reported on page 2) A sample of the product was tested and found to be in conformity with As shown in the Test Report Ref. No. which forms part of this Certificate Additional Information on page 2 IEC 62368-1:2014 E128144-A6003-CB-1 issued on 2019-09-24 This CB Test Certificate is issued by the National Certification Body Date: 2019-09-25 UL (US), 333 Pfingsten Rd IL 60062, Northbrook, USA UL (Demko), Borupvang 5A DK-2750 Ballerup, DENMARK UL (JP), Marunouchi Trust Tower Main Building 6F, 1-8-3 Marunouchi, Chiyoda-ku, Tokyo 100-0005, JAPAN UL (CA), 7 Underwriters Road, Toronto, M1R 3B4 Ontario, CANADA Signature: For full legal entity names see www.ul.com/ncbnames Jolanta M. Wroblewska 1/2

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Ref. Certif. No.
US-34471-UL
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL EQUIPMENT (IECEE)
CB SCHEME
CB TEST CERTIFICATE
Product
Wireless Gateway
Name and address of the applicant
LANTRONIX INC
7535 IRVINE CENTER DR, SUITE 100 IRVINE CA 92618
UNITED STATES
Name and address of the manufacturer
LANTRONIX INC
7535 IRVINE CENTER DR, SUITE 100 IRVINE CA 92618
UNITED STATES
Name and address of the factory
Note:
When more than one factory, please report on page 2
HANA MICROELECTRONICS CO LTD (JIA XING)
18 HANA RD XINCHENG INDUSTRIAL PARK XIUZHOU
DISTRICT JIAXING ZHEJIANG 314000
CHINA
Additional Information on page 2
Ratings and principal characteristics
Trademark (if any)
Optional
Lantronix Inc.
Type of Customer's Testing Facility (CTF) Stage used
Model / Type Ref.
SGX 35xx, SGX 51xx
See Page 2
Additional information (if necessary may also be
reported on page 2)
Additional Information on page 2
A sample of the product was tested and found
to be in conformity with
IEC 62368-1:2014
As shown in the Test Report Ref. No. which forms
part of this Certificate
E128144-A6003-CB-1 issued on 2019-09-24
This CB Test Certificate is issued by the National Certification Body
UL (US), 333 Pfingsten Rd IL 60062, Northbrook, USA
UL (Demko), Borupvang 5A DK-2750 Ballerup, DENMARK
UL (JP), Marunouchi Trust Tower Main Building 6F, 1-8-3 Marunouchi, Chiyoda-ku, Tokyo 100-0005, JAPAN
UL (CA), 7 Underwriters Road, Toronto, M1R 3B4 Ontario, CANADA
For full legal entity names see www.ul.com/ncbnames
Date:
2019-09-25
Signature:
Jolanta M. Wroblewska